| 1. | Particle size analysis - small angle x - ray scattering method
粒径分析.小角度x射线散射法 |
| 2. | The physical design of the small angle x - ray scattering branch of 1w2a beamline
小角散射光束线的物理设计 |
| 3. | Nanometer powder - determination of particle size distribution - small angle x - ray scattering method
纳米粉末粒度分布的测定x射线小角散射法 |
| 4. | Microstructure evolution in the preparation of carbon aerogels by small angle x - ray scattering
射线散射研究制备炭气凝胶过程中凝胶的微结构演化 |
| 5. | Small - angle x - ray scattering ( saxs ) is utilized to study the ordering of aot / water lamellar phase
摘要用小角x射线散射研究了aot /水层状溶致液晶的有序性。 |
| 6. | This thesis mainly expounds how to found and explain photoelectric effect , and millikan ' s experiment on light quantum and compton effect on x - ray scattering . and it emphasize on einstein ' s work in 1905
摘要介绍了光电效应的发现、光电效应理论解释、密立根光电效应实验，着重讨论了爱因斯坦在1905年提出光量子概念，从而正确解释光电效应的工作。 |
| 7. | The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ) . the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different . the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique . by using atomic force microscope ( afm ) measured surface roughness of thin films . the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ) . the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ) . in addition , the giant magnetoresistance ( gmr ) effects of different films were also measured . the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射线分析( gixa )技术对不同cu - fe薄膜的相结构进行了研究;利用xrd扫描及不同角度的2扫描对薄膜进行了结晶织构及残余应力分析;运用小角x射线散射( saxs )技术测量了薄膜的厚度;采用原子力显微镜( afm )观察了薄膜的表面形貌;运用能量损失谱( eds )及x射线荧光光谱( xrf )对薄膜进行了成分标定;使用振动样品磁强计测量了不同cu - fe过饱和固溶体薄膜的磁性能;最后利用自制的磁阻性能测试设备测量了真空磁场热处理前后不同薄膜的巨磁阻值。 |
